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HVS Technologies, Inc. designs and develops Free Space Systems for microwave and mm-wave characterization of electromagnetic properties of materials, antenna radiation pattern measurement systems, high power microwave processing systems, Microwave fixtures, and software for these systems. HVS provides solutions for high and low temperature characterization of electromagnetic properties of materials. HVS also engineers automated systems for scanning large objects for NDE / NDT and imaging applications.

 


HVS Free Space Measurement System

  • Uses spot focused antennas in microwave and mm-wave frequencies (5.8-110 GHz)

  • Characterize electromagnetic materials - dielectrics, absorbers, metamaterials, shielding materials, etc.

  • Measure electromagnetic properties - dielectric permittivity, magnetic permeability, radar absorption, chirality parameter, surface resistivity, shielding effectiveness, etc.

  • Bistatic and oblique incidence measurements

  • High temperature cell up to 1500°C and Low temperature cell down to -40°C for electromagnetic characterization of materials as a function of temperature and frequency.


HVS Automated Free Space Measurement System

  • Consists of nine servo controlled degrees of freedom. Two linear (x, z) and two rotary axes (theta, phi)  for each spot focused horn antenna. One linear positioner (y) for the sample holder
  • Scan and characterize electromagnetic materials - dielectrics, RAM, metamaterials, shielding materials, etc. over a large area.
  • Scan objects up to 36" x 12" or scan over arbitrary shaped objects from user-defined coordinates.
  • Automated bistatic and oblique incidence measurements of object under test.
  • Automated measurements as a function of polarization angle
  • Can be customized for specific application.


HVS Automated Inspection & Correction System

  • Automated near-field scanning system

  • System has up to 10 axes (degrees of freedom) for positioning antennas and Object Under Test.

  • Focused Antennas in microwave and mm-wave frequencies (5.8 to 110 GHz.)

  • Radome characterization

  • In-situ electromagnetic property mapping system for curved bodies


 


HVS Antenna Measurement System

  • HVS has engineered a low-cost system for antenna pattern measurements
  • One axis azimuth positioner with < 0.1° accuracy
  • Compact integrated positioner and control unit, with either RS-232 or Ethernet communication link.
  • Automation software for GPIB control of several vector network analyzers including the PNA from Agilent.
 

 

 

 

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