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HVS Measurement
Services
Facilities
- HP 8510C vector network analyzer
- S-Parameter test set operating
from 45 MHz to 50 GHz
- Time domain gating
- 2.4 mm Calibration Kit
- Free Space Microwave Measurement
System
- Normal incidence and bistatic
configurations
- Spot focused antennas for
C, X, Ku, K, and Ka bands
- Sample size can range from
2"x2" to 12"x12" (depends on frequency)
- Waveguides, Transitions, and
TRL Calibration Kits
- ASTM D4935-99 Flanged
Coaxial Fixture
Capabilities
- Dielectric permittivity & magnetic
permeability measurements
- Free Space or waveguide
samples
- ceramics, composites, plastics,
etc.
- powders, liquids, and gels
- Anisotropic materials
- Chirality parameter
- Free Space system is ideal
for characterizing chiral composites
- Non-contact sheet resistivity
measurements
- Characterization of:
- Radar absorbing materials
(RAM)
- Frequency Selective Surfaces
- Radome materials
- Curved samples
- Shielding Effectiveness
measurements as per ASTM D4935-99
Contact
HVS to discuss your material/device characterization needs.
We can develop custom techniques and software for unique
measurement requirements.
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